By P. W. Hawkes (auth.), Peter W. Hawkes M. A., Ph. D. (eds.)
Towards the tip of the Sixties, a few rather diversified situations mixed to release a interval of extreme job within the electronic processing of electron micro graphs. First, decades of labor on correcting the resolution-limiting aberrations of electron microscope targets had proven that those optical impediments to very excessive solution may possibly certainly be conquer, yet in basic terms on the expense of massive exper imental hassle; thank you mostly to the theoretical paintings of ok. -J. Hanszen and his colleagues and to the experimental paintings of F. Thon, the notions of move func tions have been starting to supplant or supplement the innovations of geometrical optics in electron optical pondering; and at last, huge speedy desktops, in a position to manipu lating great snapshot matrices in an inexpensive time, have been greatly available. therefore the concept recorded electron microscope photographs can be stronger indirectly or rendered extra informative by means of next laptop processing progressively received floor. initially, such a lot attempt used to be focused on three-d reconstruction, particu larly of specimens with traditional symmetry which may be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, even though, R. W. Gerchberg and W. O. Saxton defined an iterative set of rules that during precept yielded the section and amplitude of the electron wave rising from a strongly scattering speci men.
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1451. 146-1501. These systems were designed for a variety of reasons, though always with the idea of exposing the specimen to as low a dose of electrons as possible in mind. 1511, recognizing that such a direct link should be useful for rapid focusing and stigmator adjustment, showed that the autocorrelation function of a reasonably amorphous region of the specimen gives information about the defocus and the astigmatism of the objective lens simultaneously. 1521). B. Real-time diffractometry using the properties of a thermoplastic converter.
Maher: Phil. Mag. H. Downing: Proc. 30th Annual Meeting EMSA, Los Angeles, ed. J. Arceneaux (Claitor, Baton Rouge 1972) pp. H. Downing: Froc. 35th Annual Meeting EMSA, Boston, ed. W. Bailey (Claitor, Baton Rouge 1977) pp. H. M. H. M. Siegel: Canberra (1974), Vol. 1, pp. H. M. Siegel: Optik 42. H. J. Hanszen: Z. Naturforsch. R. Harris, J. Kerr: J. Microsc. B. Haydon: J. Microsc. B. A. Lemons: J. Microsc. B. C. A. Lemons: Froc. 29th Annual Meeting EMSA, Boston, ed. J. Arceneaux (Claitor, Baton Rouge 1971) pp.
Mag. H. Downing: Proc. 30th Annual Meeting EMSA, Los Angeles, ed. J. Arceneaux (Claitor, Baton Rouge 1972) pp. H. Downing: Froc. 35th Annual Meeting EMSA, Boston, ed. W. Bailey (Claitor, Baton Rouge 1977) pp. H. M. H. M. Siegel: Canberra (1974), Vol. 1, pp. H. M. Siegel: Optik 42. H. J. Hanszen: Z. Naturforsch. R. Harris, J. Kerr: J. Microsc. B. Haydon: J. Microsc. B. A. Lemons: J. Microsc. B. C. A. Lemons: Froc. 29th Annual Meeting EMSA, Boston, ed. J. Arceneaux (Claitor, Baton Rouge 1971) pp.